Contact Us
Dr. S. Gunasekaran
Dean, Research & Development
Heading, SAIF-SPIHER
St. Peter’s Institute of Higher Education & Research
Avadi, Chennai – 600 054.
Ph: 044 - 26558080 - 85
E-mail: saifspu@gmail.com

Internship Programme
Internship Programme for PG Students

SAIF-SPIHER organizes a 21 day Internship programme for I PG Physics/ Chemistry students of various colleges. This programme fillips the young students to take up their project work with deeper understanding over characterization techniques. The internship programme offers the theoretical and experimental knowledge on spectroscopic techniques and Group theory. The working principle and applications of FTIR-ATR, UV-Vis DRS/DTS and PL spectroscopic techniques will be taught to the participants. The Internship programme will be organized during every May month at nominal fee of Rs. 1000/- per candidate. The participants who are attending the programme for 21 days without fail will be accredited with a certificate.


Events
Veteran Scientists’ Visit to SAIF-SPIHER – February 2016
Veteran Scientists and Spectrophysicists Prof. Dr. K.P.Rajappan Nair (India/Germany) and Dr. Lalji dixit (India) lead team of foreign scientists, Dr. Jens-Uwe-Grabow (Germany), Dr. Thomas Giesen (Germany), Dr. Michael Schmidtt (Germany), Prof. Irena Kostova (Bulgaria), Prof. Danka Obreshkova (Bulgaria), Prof. Jiban Podder (Bangladesh), Prof. Zainul A. Siddique (Bangladesh), has visited SAIF-SPIHER and rejoiced the real-time applications of Attenuated Total Reflectance in FTIR Spectroscopy. Scientists have also made many suggestions and idea to the research scholars of SAIF-SPIHER about the utilization of reflectance and derivative spectroscopy.
Scientists Visit to SAIF-SPIHER – February 2016
 
NWAIT’15
SAIF-SPIHER has organized a National Workshop on Analytical Instrumentation Technique – 2015 (NWAIT’15), a grand scientific event was organized to create awareness and hands on training to the researchers about the advanced reflectance spectroscopic techniques to characterize the new materials. More than 50 participants have got benefitted with the Lectures delivered by Dr. S. Gunasekaran, Dean (R&D), St. Peter’s Institute of Higher Education & Research and Dr. G. Anbalagan, Professor, Department of Nuclear Physics, University of Madras, over ATR- A Fortune to FTIR Spectroscopy for Materials Characterization and UV-Visible Spectroscopy for Materials Characterization. In continuation to the lectures, experimental demonstrations were made at SAIF-SPIHER. NWAIT 2015
 

Facilities
PERKIN ELMER - SPECTRUM TWO FTIR/ATR SPECTROMETER
The infrared spectrum originates from the vibrational motion of the molecule. The vibrational frequencies are a kind of fingerprint of the compounds. This property is used for characterization of organic, inorganic and biological compounds. The band intensities are proportional to the concentration of the compound and hence quantitative estimations are possible. The IR spectroscopy is also carried out by using Fourier transform technique.
Description
The interference pattern obtained from a two beam interferometer as the path difference between the two beams is altered, when Fourier transformed, gives rise to the spectrum. The transformation of the interferogram into spectrum is carried out mathematically with a dedicated on-line computer.

PerkinElmer Spectrum Two FTIR-ATR Spectrophotometer

PerkinElmer Spectrum Two FTIR-ATR Spectrophotometer

The Perkin Elmer Spectrum Two FT-IR instrument consists of globar and mercury vapor lamp as sources, an interferometer chamber comprising of KBr and mylar beam splitters followed by a sample chamber and detector. Entire region of 4000 – 400 cm-1 is covered by this instrument. The spectrometer works under purged conditions. Solid samples are dispersed in KBr or polyethylene pellets depending on the region of interest. This instrument has a typical resolution of 0.5 cm-1. Signal averaging, signal enhancement, base line correction, normalization and other spectral manipulations are possible.

The FT-IR Spectroscopy is also carried out by using ATR Diamond Accessory. Reflection which occurs when, an absorbing coupling mechanism acts in the process of Total Internal Reflection to make the Reflectance less than unity. In this process, if the absorbing sample is placed in contact with the reflecting surface, the reflectance for total internal reflection will be attenuated to some value between greater than zero and unity in regions of the spectrum, where absorption of the radiant power can take place. The technique of Attenuated Total Reflectance (ATR) has in recent years revolutionized solid and liquid sample analyses because it combats the most challenging aspects of infrared analyses, namely sample preparation and spectral reproducibility. In no time the spectrum software provides, derivative (up to fourth derivative) and mathematically modified spectra of the samples.

Optical Path Schematic of FTIR-ATR Spectrophotometer

Instrument Details

Model Spectrum Two FTIR/ATR Spectrometer
Scan Range MIR 4000 - 400cm-1
Resolution 0.5 cm-1 onwards
Internal Reflection Element (IRE) Diamond
Refractive Index 2.4
Sample required 1-2 mg (Solid)/ 1-2 ml (liquid other than water)
Mode of Analysis Absorbance/ Transmittance

Applications

Infrared spectrum is useful in identifying the functional groups like -OH, -CN, -CO, -CH, -NH2, etc. Also quantitative estimation is possible in certain cases for chemicals, pharmaceuticals, petroleum products, etc. Resins from industries and rubber samples can be analyzed (based on the refractive index of the samples). Blood and food materials can also be studied.

PERKIN ELMER LAMBDA 35 UV Vis DRS/DTS Spectrometer

The UV-VIS spectrum is due to the electronic transitions of the molecule. Qualitative and quantitative estimations of compounds are possible by this non destructive technique.

Description

The Absorbance (A) of a solution at a particular wavelength is given by Beer-Lambert's law ect = A where c is the concentration of the compound, t is the thickness of the cell and e is the molar extinction coefficient characteristic of the compound at a given wavelength. This principle is used for quantitative measurements.

When electromagnetic radiation in the UV/Visible wavelength range interacts with a sample, four results are possible: the radiation is absorbed, transmitted, reflected or scattered. Typically UV/Vis spectrometers are equipped to measure the transmittance or absorbance of a transparent solid or homogenous solution. However, when equipped with the proper accessories, UV/Vis instruments can measure the reflected and scattered energy from a sample. An integrating sphere, when used in combination with the UV-Visible spectrometer, is a valuable tool for collecting and measuring specular and/or diffuse reflectance. By placing the sample at the entrance to the sphere, transmitted light enters the sphere and is collected and measured at the detector in diffuse transmittance mode. Alternatively, by placing a sample at the exit of the sphere, reflected light is collected and measured at the detector in diffuse reflectance mode. The reflectance spectrum may be converted to Kubelka-Munk spectrum for further studies.

PerkinElmer Lambda 35 UV-Vis DRS/DTS Spectrometer

The spectrometer is well suited for samples both in solid and the dissolved (solution) form. The spectral range with appropriate solvent is 190-1100 nm and also it can be used to study single crystals and powder samples. Base line correction, Normalization, repetitive scan, kinetics, derivative and concentration modes are possible.

DRS/DTS Setup of Lambda 35 UV-Vis

Measurement Principles of the Integrating Sphere

Optical Path Schematics of UV-Vis DRS/DTS Spectrophotometer

Instrument Details
ModelLambda 35 UV - Vis DRS/DTS Spectrometer
Scan Range190 – 1100 nm
Bandwidth0.5 – 4 nm (variable)
Mode of AnalysisTransmittance/ Absorbance/ Reflectance
Sample required5-10 mg (DRS) & 1-2 mg with Solvent (%T)
Applications

Qualitative and quantitative studies of materials and study of molecular structure, reaction kinetics, defect solid state, color centres, etc. The variable bandwidth of the LAMBDA 35 offers the best solution for measurements on solids, pastes and powders.

PERKIN ELMER – LS 45 LUMINESCENCE SPECTROMETER

The LS 45 is a computer controlled, modular Photoluminescence spectrometer for measuring steady state luminescence spectra in the ultraviolet to near infrared spectral range with single photon counting sensitivity. It combines ultimate sensitivity with high spectral resolution and excellent stray light rejection. The performance of the PL spectrometer makes it ideally suited for demanding applications in the broad areas of photophysics, photochemistry, biophysics and materials research. Photoluminescence spectrometers provide the ultimate blend of high performance, reliability, ease-of-use, durability and versatility.

Optical Path Schematic of Photoluminescence Spectrometer

Optical Path Schematic of Photoluminescence Spectrometer

Description

The Perkin Elmer LS 45 Luminescence Spectrometer has been developed in conjunction with a host of software and accessories to address a wide range of applications that require challenges in fluorescence, phosphorescence, chemi or Bio- luminescence. This instrument uses a high energy pulsed xenon source for excitation to minimize photo bleaching of samples and provide a long live excitation source. The Spectrophotometer can be calibrated by using a standard fluorescent material.

The Luminescence spectrometer offers versatility, reliability and ease- of- use. This is an instrument with all of the heritage, sensitivity and reliability.

This Monochromator based instrument uses a high energy pulsed xenon source for excitation. The software combines the user friendly appeal of a Windows based software package with application specific knowledge. The result is a powerful system that can be used routinely for quality fluorescence analyses.


Instrument Details
Model LS 45 Spectrofluorimeter
OpticsExcitation 200 – 800 nm; Emission 200 – 650 nm
Wavelength Accuracy+1nm

Applications

Because of its greater sensitivity, fluorescence spectroscopy has many applications, it is increasingly employed for the identification of compounds and conformational studies, it is a powerful technique for studying the dynamical properties of biological molecules in solution. Fluorescence life time measurements can be used to obtain structural information on the fluorescing species and on kinetics of energy transfer.


About SAIF

Analytical Instrumentation Facility of St. Peter’s Institute of Higher Education and Research (SAIF-SPIHER) stands tall today as a central sophisticated instrumentation facility of St. Peter’s Institute of Higher Education and Research, since its establishment in the year 2014. SAIF-SPIHER facilitates the researchers of all and the sundry associated with research by providing guidance in acquisition of data using the advanced reflectance and the transmittance spectroscopic techniques viz., FTIR-ATR, UV-Vis DRS/DTS and Photo Luminescence spectral measurements. SAIF-SPIHER also extends its consultancy services to Industries, R&D laboratories and institutions. SAIF-SPIHER organizes workshops in regular manner on the working principle and application of the available spectroscopic techniques at SAIF-SPIHER for students, teachers and personnel from other Laboratories, Universities and Industries. SAIF-SPIHER provides facilities of sophisticated instruments to scientists and other users from academic institutes, R&D laboratories and industries to enable them to carry out measurements for R&D work. SAIF-SPIHER offers instrumentation facilities to scientists at affordable charges for unveiling new dimensions in research in various areas of science and technology.

How to Submit the Samples

The samples should be submitted in the prescribed format indicating the information called for as well as your special requirement, if any. If you are sending them by post, please enclose the payment along with the samples and address the same to:

The Dean , Research and Development St. Peter’s Institute of Higher Education and Research Avadi, Chennai - 600 054.

Only on receipt of the payment along with the samples, they will be registered for analysis and taken up for measurement as per the seniority/queue of the users of the instrument concerned. As soon as the analysis is over, the spectra along with the receipt / bill will be sent to the users. While submitting samples for more than one analysis separate samples are to be sent for each.

An Important notice

As per the guidelines of the St. Peter’s Institute of Higher Education and Research, in all publications of research work,  where in the  analytical services of the SAIF have been made use of,  the SPIHER and the SAIF, SPIHER, Chennai, shall be duly acknowledged.

A list of charges for spectral measurements is annexed. A "Three Tier" Charge System is being followed. Please note that:

  • The charges mentioned are for analysis of samples received from users within India only.
  • For overseas users, please contact SAIF by Email directly.
  • Charges are subject to change periodically
Mode of Payment

Please note the current policy on payment of analysis charges: Our current policy requires analysis that payment be received before the samples can be registered and analysis taken up. Please make sure that the payment is received along with the samples. Payments are to be made only by crossed demand draft (DD).

The DD must be drawn in favour of:

St. Peter’s Institute of Higher Education and Research
payable at Chennai and must be sent along with samples and Registration form to:
The Dean , Research and Development
St. Peter’s Institute of Higher Education and Research
Avadi, Chennai - 600 054.

Please note that in the event the DD amount/payment received is more than the actual analyses charges incurred, it will NOT be possible to refund the excess amount paid. However, the excess amount may be adjusted against future analyses by the same user or another user from the same organization following a written request by Email or hard copy.

List of charges with effect from 1st JULY 2014 (Inclusive of service tax) and the prescribed format for sample submission are available in www.spiher.ac.in